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energy dispersive analysis by X-rays

См. также в других словарях:

  • Energy-dispersive X-ray spectroscopy — (EDS, EDX or EDXRF) is an analytical technique used for the elemental analysis or chemical characterization of a sample. As a type of spectroscopy, it relies on the investigation of a sample through interactions between electromagnetic radiation… …   Wikipedia

  • List of materials analysis methods — List of materials analysis methods: Contents: Top · 0–9 · A B C D E F G H I J K L M N O P Q R S T U V W X Y Z μSR see Muon spin spectroscopy …   Wikipedia

  • surface analysis — ▪ chemistry Introduction       in analytical chemistry (chemistry), the study of that part of a solid that is in contact with a gas or a vacuum. When two phases of matter are in contact, they form an interface. The term surface is usually… …   Universalium

  • Wavelength dispersive X-ray spectroscopy — The Wavelength dispersive X ray spectroscopy (WDXRF or WDS) is a method used to count the number of X rays of a specific wavelength diffracted by a crystal. The wavelength of the impinging x ray and the crystal s lattice spacings are related by… …   Wikipedia

  • EDAX — [Abk. für gleichbed. engl. energy dispersive analysis of X rays]: svw. energiedispersive Röntgenspektroskopie …   Universal-Lexikon

  • X-ray fluorescence — (XRF) is the emission of characteristic secondary (or fluorescent) X rays from a material that has been excited by bombarding with high energy X rays or gamma rays. The phenomenon is widely used for elemental analysis and chemical analysis,… …   Wikipedia

  • X-ray — [ 22 December 1895 and presented to Professor Ludwig Zehnder of the Physik Institut, University of Freiburg, on 1 January 1896. The dark oval on the third finger is a shadow produced by her ring. [cite book last = Kevles first =Bettyann Holtzmann …   Wikipedia

  • Spectrométrie de fluorescence X — Pour les articles homonymes, voir SFX, FX et XRF. Un chimiste manipule un goniomètre manuel pour l analyse par spectrométrie de fluorescence X de monocristaux d échant …   Wikipédia en Français

  • Scanning electron microscope — These pollen grains taken on an SEM show the characteristic depth of field of SEM micrographs …   Wikipedia

  • Fluorescence X — Spectrométrie de fluorescence X Pour les articles homonymes, voir SFX, FX et XRF. Un spectromètre de fluorescence X Philips PW1606 avec manutention automatiq …   Wikipédia en Français

  • Spectrometrie de fluorescence X — Spectrométrie de fluorescence X Pour les articles homonymes, voir SFX, FX et XRF. Un spectromètre de fluorescence X Philips PW1606 avec manutention automatiq …   Wikipédia en Français

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